Image Is the Highest Resolution We've Ever Seen Atoms: ScienceAlert
Researchers led by Zhen Chen achieved the highest resolution atomic image using ptychography, depicting praseodymium orthoscandate's crystal lattice. This breakthrough enhances studies in materials science and quantum communications.
Read original article
A team of researchers led by physicist Zhen Chen has achieved a groundbreaking advancement in atomic imaging, producing the highest resolution image of atoms to date. The image, created in 2021, depicts the crystal lattice of praseodymium orthoscandate (PrScO3) at a magnification of 100 million. The slight fuzziness observed in the image is attributed to thermal motion blur, not poor resolution. This achievement utilizes a technique called ptychography, which generates images from interference patterns created by electrons bouncing off atoms. The image reveals three types of atoms: praseodymium, scandium, and oxygen, all forming a perfect crystal structure. This advancement is significant as it sets a near-ultimate limit for atomic resolution, enabling new measurement possibilities in various fields, including materials science and quantum communications. Physicist David Muller emphasized the transformative potential of this technology, likening it to upgrading from poor to excellent vision. The full research findings are published in the journal Science.
- Researchers have produced the highest resolution image of atoms using ptychography.
- The image shows the crystal lattice of praseodymium orthoscandate at a magnification of 100 million.
- The slight fuzziness in the image is due to thermal motion of atoms, not resolution issues.
- This breakthrough allows for advanced studies in materials science and quantum communications.
- The research highlights the potential for significant advancements in atomic imaging technology.
Related
Nuclear spectroscopy breakthrough could rewrite fundamental constants of nature
Breakthrough in nuclear spectroscopy at UCLA enhances atomic clock precision using thorium-229 nucleus excited by laser in fluorine-rich crystal. Research by Prof. Eric Hudson could redefine fundamental constants and improve deep space technology.
A quantum sensor for atomic-scale electric and magnetic fields
Researchers developed a quantum sensor using iron atoms and PTCDA molecules on a scanning tunneling microscope tip, achieving high sensitivity for detecting atomic-scale electric and magnetic fields with sub-angstrom resolution.
X-Ray Upgrade Can See Transistors in 3D
An upgraded X-ray imaging technique called burst ptychography achieves 4-nanometer resolution, enabling non-destructive 3D imaging of semiconductor chips, enhancing quality control and defect identification in manufacturing processes.
X-Rays Image Transistors in 3D
An upgraded X-ray imaging technique, burst ptychography, achieves 4-nanometer resolution for 3D imaging of semiconductor chips, enhancing defect analysis and quality control in manufacturing, with potential for 1-nanometer resolution.
X-Rays Image Transistors in 3D
An upgraded X-ray imaging technique, burst ptychography, achieves 4-nanometer resolution for non-destructive 3D imaging of semiconductor chips, improving defect identification and supporting the complexity of modern chip designs.
2 commentsSlow news day?
Related
Nuclear spectroscopy breakthrough could rewrite fundamental constants of nature
Breakthrough in nuclear spectroscopy at UCLA enhances atomic clock precision using thorium-229 nucleus excited by laser in fluorine-rich crystal. Research by Prof. Eric Hudson could redefine fundamental constants and improve deep space technology.
A quantum sensor for atomic-scale electric and magnetic fields
Researchers developed a quantum sensor using iron atoms and PTCDA molecules on a scanning tunneling microscope tip, achieving high sensitivity for detecting atomic-scale electric and magnetic fields with sub-angstrom resolution.
X-Ray Upgrade Can See Transistors in 3D
An upgraded X-ray imaging technique called burst ptychography achieves 4-nanometer resolution, enabling non-destructive 3D imaging of semiconductor chips, enhancing quality control and defect identification in manufacturing processes.
X-Rays Image Transistors in 3D
An upgraded X-ray imaging technique, burst ptychography, achieves 4-nanometer resolution for 3D imaging of semiconductor chips, enhancing defect analysis and quality control in manufacturing, with potential for 1-nanometer resolution.
X-Rays Image Transistors in 3D
An upgraded X-ray imaging technique, burst ptychography, achieves 4-nanometer resolution for non-destructive 3D imaging of semiconductor chips, improving defect identification and supporting the complexity of modern chip designs.